Scanning electron microscope at low voltage operation - a unique characterization tool for graphene layers Iwona Jóźwik. - Digital Repository of Scientific Institutes

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Scanning electron microscope at low voltage operation - a unique characterization tool for graphene layers Iwona Jóźwik.

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Title: Scanning electron microscope at low voltage operation - a unique characterization tool for graphene layers Iwona Jóźwik.

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Skaningowy mikroskop elektronowy pracujący w zakresie niskich wartości napięcia przyspieszającego jako unikatowe narzędzie do charakteryzacji warstw grafenu

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Instytut Technologii Materiałów Elektronicznych. Wyd.

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References: p.: 15-16 ; p.: 11-16, il. 30 cm.

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15-16

Relation:

Materiały Elektroniczne - Electronic Materials

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A4 ; application/pdf

Resource Identifier:

oai:rcin.org.pl:63366

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Rights Reserved - Free Access

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Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

European Union. European Regional Development Fund ; Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure

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Subject and keywords:

Graphene Graphene characterization Low-kV scanning electron microscopy

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Last modified:

Mar 30, 2021

In our library since:

Oct 18, 2017

Number of object content downloads / hits:

209

All available object's versions:

https://rcin.org.pl./publication/83005

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MATERIAŁY ELEKTRONICZNE

Edition name	Date
Jóźwik Iwona, Scanning electron microscope at low voltage operation - a unique characterization tool for graphene layers	Mar 30, 2021

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