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RCIN and OZwRCIN projects

Object

Title: Pomiar koncentracji nosników ładunku w płytkach monokryształów objętościowych i warstwach epitaksjalnych SiC za pomocą sondy rtęciowej = Measurement of charge carrier concentration in SiC wafers of bulk crystals and epitaxial layers using mercury probe

Object collections:

Last modified:

Oct 2, 2020

In our library since:

Jun 29, 2012

Number of object content downloads / hits:

1035

All available object's versions:

https://rcin.org.pl./publication/15968

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