Badania metodami rentgenowskiej topografii dyfrakcyjnej defektów strukturalnych monokryształów Y2Al5O12 silnie domieszkowanych neodymem = The investigation of structural defects in the heavily Nd - doped YAG crystals by means of \\x-ray diffraction topography

Mazur Krystyna

$Badania metodami rentgenowskiej topografii dyfrakcyjnej defektów strukturalnych monokryształów Y2Al5O12 silnie domieszkowanych neodymem = The investigation of structural defects in the heavily Nd - doped YAG crystals by means of \\x-ray diffraction topography$

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Title: Badania metodami rentgenowskiej topografii dyfrakcyjnej defektów strukturalnych monokryształów Y2Al5O12 silnie domieszkowanych neodymem = The investigation of structural defects in the heavily Nd - doped YAG crystals by means of \\x-ray diffraction topography

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application/pdf

Resource Identifier:

oai:rcin.org.pl:9943

Source:

ITME, sygn. dostępny ; click here to follow the link

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pol

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Institute of Electronic Materials Technology

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Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

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Subject and keywords:

Electronic - journal - material Electronic materials X-ray diffraction topography structural defect Nd:YAG

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Oct 2, 2020

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Aug 9, 2012

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MATERIAŁY ELEKTRONICZNE

Edition name	Date
Mazur Krystyna, Badania metodami rentgenowskiej topografii dyfrakcyjnej defektów strukturalnych monokryształów Y2Al5O12 silnie domieszkowanych neodymem	Oct 2, 2020