Title:

Investigation of oxide crystals by means of synchrotron and conventional X-raydiffraction topography Wojciech Wierzchowski, Agnieszka Malinowska, Krzysztof Wieteska, Edyta Wierzbicka, Krystyna Mazur, Maria Lefeld - Sosnowska, Marek Świrkowicz, Tadeusz Łukasiewicz.

Subtitle:

Badanie monokryształów tlenkowych za pomocą synchrotronowej i konwencjonalnej rentgenowskiej topografii dyfrakcyjnej

Creator:

Wierzchowski Wojciech

Contributor:

Malinowska Agnieszka ; Wieteska Krzysztof ; Wierzbicka Edyta ; Mazur Krystyna ; Lefeld - Sosnowska Maria ; Świrkowicz Marek ; Łukasiewicz Tadeusz

Publisher:

ITME

Place of publishing:

Warsaw

Date issued/created:

2016

Description:

Bibliogr. s.: 29 - 32 ; s.: 17 - 32 il., 30 cm.

Type of object:

Book/Chapter

Subject and Keywords:

X-ray diffraction topography ; crystal lattice defects ; Czochralski method

References:

29-32

Relation:

Materiały Elektroniczne - Electronic Materials Vol. 44 No. 4 2016

Volume:

44

Issue:

4

Start page:

17

End page:

32

Resource type:

Text

Detailed Resource Type:

Article

Format:

A4 ; application/pdf

Source:

click here to follow the link

Language:

eng

Language of abstract:

eng

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Activities popularizing science (DUN) ; Ministry of Science and Higher Education

Access:

Open