Title:

X-ray diffraction topography of lattice defects in MgAl2O4 and ScAlMgO4 crystals grown under different technological conditions

Subtitle:

Electronic Materials T 43 Nr 1 2015

Creator:

Wierzbicka Edyta

Contributor:

Malinowska Agnieszka ; Wierzchowski Wojciech ; Kisielewski Jarosław ; Świrkowicz Marek ; Szyrski Włodzimierz ; Romaniec Magdalena ; Mazur Krystyna

Publisher:

ITME

Place of publishing:

Warszawa

Date issued/created:

2015

Description:

Bibliogr. p.: 38-39 ; p. 29-39 il., 30 cm.

Subject and Keywords:

X-ray diffraction topography ; MgAl2O4 ; ScAlMgO4 ; crystal lattice defects ; Czochralski method

References:

38-39

Relation:

Electronic Materials T. 43 Nr 1 2015

Volume:

43

Issue:

1

Start page:

29

End page:

39

Resource type:

Text

Detailed Resource Type:

Article

Format:

30 cm ; application/pdf

Source:

click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open