Title:

Deep defect centres in ultra-high-resistivity FZ silicon

Subtitle:

Electronic Materials V. 42 No 4

Creator:

Kamiński Paweł

Contributor:

Kozłowski Roman ; Krupka Jerzy ; Kozubal Michał ; Wodzyński Maciej ; Żelazko Jarosław

Publisher:

ITME.

Place of publishing:

Warszawa

Date issued/created:

2014

Description:

Bibliogr. p.: 23-24 ; s.:16-24 il. 30 cm.

Type of object:

Book/Chapter

Subject and Keywords:

deep defect centers ; HRPITS ; ultra-high-resistivity silicon

References:

p.: 23-24

Relation:

Electronic Materials

Volume:

42

Issue:

4

Start page:

16

End page:

24

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open