Title:

Rentgenodyfrakcyjna analiza odkształceń koherentnych w półprzewodnikowych strukturach warstwach AIIIBV. praca doktorska = X-ray diffractiometric analysis of coherence deformation in AIIIBV semiconductor layered structures

Subtitle:

Prace doktorskie

Creator:

Sass Jerzy

Contributor:

Pajączkowska Anna : Promotor.

Publisher:

ITME

Place of publishing:

Warszawa

Date issued/created:

1998

Description:

92 s. : il. 24 cm. ; Bibliogr. s. 89-92

Type of object:

Book/Chapter

Subject and Keywords:

Electronic - materials ; x-ray diffraction ; epitaxial layer ; AIIIBV ; misfitdislocation

Relation:

PhD Dissertations

Start page:

1

End page:

92

Resource type:

Text

Detailed Resource Type:

PhD Dissertations

Format:

application/pdf

Source:

ITME, sygn. P/1676 ; click here to follow the link

Language:

pol

Rights:

Rights Reserved - Restricted Access

Terms of use:

Copyright-protected material. Access only for persons authorised by the Institute of Electronic Materials Technology.

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Closed