Title:

Metody pomiaru parametrów aplikacyjnych past i warstw grubych. Cz. I = Measuring methods of application parameters of pastes and thick layers. Part I

Subtitle:

Prace ITME1982 z. 4

Creator:

Szymański Dariusz

Contributor:

Szczytko Barbara

Publisher:

Wydaw. Przem. Masz. "WEMA"

Place of publishing:

Warszawa

Date issued/created:

1982

Description:

65, [2} s. : il. 24 cm. ; Bibliogr. s. 63-65

Subject and Keywords:

Electronic - journal - material ; Electronic materials ; dielectric paste ; thick film resistor ; test patlern

Relation:

Proceedings of ITME

Issue:

4

Start page:

3

End page:

65

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

ITME, sygn. dostępny ; click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open