Title:

Pomiar koncentracji nosników ładunku w płytkach monokryształów objętościowych i warstwach epitaksjalnych SiC za pomocą sondy rtęciowej = Measurement of charge carrier concentration in SiC wafers of bulk crystals and epitaxial layers using mercury probe

Subtitle:

Materiały Elektroniczne 2008 T.36 nr 2

Creator:

Brzozowski Andrzej

Publisher:

ITME

Place of publishing:

Warszawa

Date issued/created:

2008

Description:

Bibliogr. s.65 ; 53-66 s. : il. 24 cm.

Subject and Keywords:

Electronic - journal - materials ; Electronic - materials ; SiC ; charge carier concentration ; mercury probe

Relation:

Electronic Materials

Volume:

36

Issue:

2

Start page:

53

End page:

66

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

ITME, sygn. dostępny ; click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open