Title:

HRXRD study of ZnO single crystals bombarded with Ar ions

Subtitle:

Badanie metodamia wysokorozdzielczej dyfraktometrii rentgenowskiej monokryształów ZnO bombardowanych jonami Ar

Creator:

Wójcik Marek

Contributor:

Gaca Jarosław ; Caban Piotr ; Turos Andrzej

Publisher:

ITME

Place of publishing:

Warsaw

Date issued/created:

2016

Description:

References p.: 15-16 ; p.: 9-16, il., 30 cm.

Subject and Keywords:

HRXRD ; ZnO monocrystal ; Ion implantation ; Radiation defect analysis

References:

15-16

Relation:

Materiały Elektroniczne - Electronic Materials

Volume:

44

Issue:

3

Start page:

9

End page:

16

Resource type:

Text

Detailed Resource Type:

Article

Format:

A4 ; application/pdf

Source:

click here to follow the link

Language:

eng

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Ministry of Science and Higher Education ; Activities popularizing science (DUN)

Access:

Open