Title:

Metody korekcyjne ilościowej mikroanalizy rentgenowskiej pierwiastków lekkich = Correction methods in quantitative x-ray microanalysis of light elements

Subtitle:

Prace ITME1983 z. 7

Creator:

Kaczyński Łukasz

Publisher:

Wydaw. Przem. Masz. "WEMA"

Place of publishing:

Warszawa

Date issued/created:

1983

Description:

36 s. : il. 24 cm ; Bibliogr. s.34-36

Subject and Keywords:

quantitative X-ray microanalysis ; light element ; correction method

Relation:

Electronic Materials

Issue:

7

Start page:

3

End page:

36

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Institute of Electronic Materials Technology

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open