Title:

Wyznaczanie czasu życia nosników ładunku i poziomów rekombinacyjnych w materiałach wysokorezystywnych poprzez pomiar temperaturowej zależności fotoprąd = Determination of carrier lifetime and recombination levels in high-resistivity materials from photocurrent measurements

Subtitle:

Materiały Elektroniczne 2000 T.28 nr 1/2

Creator:

Kozłowski Roman

Publisher:

ITME

Place of publishing:

Warszawa

Date issued/created:

2000

Description:

5-17 s. : il. 24 cm. ; Bibliogr. s. 17

Subject and Keywords:

Electronic - journal - materials ; Electronic- materials ; recombination lifetime ; photocurrent ; high-resistivity material

Relation:

Electronic Materials

Volume:

28

Issue:

1/2

Start page:

5

End page:

17

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

ITME, sygn. dostępny ; click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open