Title:

Opracowanie wzorców używanych przy określeniu czystości materiałów elektronicznych metodami spektroskopowymi = Synthetic standards for trace analysis of electronic materials by atomic spectrometry techniques

Subtitle:

Materiały Elektroniczne 1992 T.20 nr 4

Creator:

Sokołowska Wanda

Contributor:

Waśkiewicz Lidia

Publisher:

ITME

Place of publishing:

Warszawa

Date issued/created:

1992

Description:

58-72 s. : il. ; 24 cm. ; Bibliogr. s. 72

Subject and Keywords:

Electronic - materials ; standard for trace analisis ; atomic spectrometry technique

Relation:

Electronic Materials

Volume:

20

Issue:

4

Start page:

58

End page:

72

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

ITME, sygn. dostępny ; click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open