Title:

Numeryczne metody rozpłatania rentgenowskiego widma dyfrakcyjnego. Zastosowanie do badania supersieci półprzewodnikowych = The numerical x-ray peaks refinements applied to the semiconductor superlattice spectra

Subtitle:

Materiały Elektroniczne 1992 T.20 nr 3

Creator:

Gaca Jarosław

Contributor:

Sass Jerzy ; Wójcik Marek

Publisher:

ITME

Place of publishing:

Warszawa

Date issued/created:

1992

Description:

47-63 s. : il. ; 24 cm. ; Bibliogr. s. 62-63

Subject and Keywords:

Electronic - materials ; Electronic - journal - materials ; semiconductor spectra ; x-ray diffraction spectra

Relation:

Electronic Materials

Volume:

20

Issue:

3

Start page:

47

End page:

63

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open