Title:

Nowa metoda identyfikacji typu dyslokacji na podstawie topografii rentgenowskiej Langa = A new identification method of the dislocation type based on the Lang topography

Subtitle:

Materiały Elektroniczne 1978 nr 3(23)

Creator:

Majcher Krzysztof

Publisher:

Wydaw. Przemysłu Maszynowego "WEMA"

Place of publishing:

Warszawa

Date issued/created:

1979

Description:

s. 22-24 : il. ; 24 cm. ; Bibliogr. s. 24

Type of object:

Book/Chapter

Subject and Keywords:

Electronic - materials ; Electronic - journal - materials ; dislocation ; x-ray topography

Relation:

Electronic Materials

Volume:

23

Issue:

3

Start page:

22

End page:

24

Resource type:

Text

Detailed Resource Type:

Article

Format:

application/pdf

Source:

ITME, sygn. dostępny ; click here to follow the link

Language:

pol

Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Open