@misc{Wierzchowski_Wojciech_Investigation_2016,
 author={Wierzchowski Wojciech},
 volume={44},
 editor={Malinowska Agnieszka},
 editor={Wieteska Krzysztof},
 editor={Wierzbicka Edyta},
 editor={Mazur Krystyna},
 editor={Lefeld - Sosnowska Maria},
 editor={Świrkowicz Marek},
 editor={Łukasiewicz Tadeusz},
 number={4},
 copyright={Rights Reserved - Free Access},
 journal={Materiały Elektroniczne - Electronic Materials Vol. 44 No. 4 2016},
 address={Warsaw},
 howpublished={online},
 year={2016},
 publisher={ITME},
 language={eng},
 title={Investigation of oxide crystals by means of synchrotron and conventional X-raydiffraction topography Wojciech Wierzchowski, Agnieszka Malinowska, Krzysztof Wieteska, Edyta Wierzbicka, Krystyna Mazur, Maria Lefeld - Sosnowska, Marek Świrkowicz, Tadeusz Łukasiewicz.},
 type={Text},
 URL={http://rcin.org.pl./Content/65471/PDF/ME416wierzchowski.pdf},
 keywords={X-ray diffraction topography, crystal lattice defects, Czochralski method},
}