@misc{Szymański_Dariusz_Metody_1982,
 author={Szymański Dariusz},
 number={4},
 editor={Szczytko Barbara},
 copyright={Rights Reserved - Free Access},
 address={Warszawa},
 journal={Proceedings of ITME},
 howpublished={online},
 year={1982},
 publisher={Wydaw. Przem. Masz. "WEMA"},
 language={pol},
 title={Metody pomiaru parametrów aplikacyjnych past i warstw grubych. Cz. I = Measuring methods of application parameters of pastes and thick layers. Part I},
 type={Text},
 URL={http://rcin.org.pl./Content/29989/PDF/WA901_18696_r1982-z4_Prace-ITME-Szczytko_i.pdf},
 keywords={Electronic - journal - material, Electronic materials, dielectric paste, thick film resistor, test patlern},
}